Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy
نویسندگان
چکیده
منابع مشابه
Force Spectroscopy with the Atomic Force Microscope
Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2020
ISSN: 2190-4286
DOI: 10.3762/bjnano.11.77